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1 article(s) from Ren, Juan

High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

Juan Ren and
Qingze Zou

Beilstein J. Nanotechnol. 2017, 8, 1563–1570, doi:10.3762/bjnano.8.158

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Figure 1: Images of the PS–LDPE sample topography (scan area: 50 μm × 25 μm, scan direction: 50 μm). the corr...

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Figure 2: Images of the SBS sample topography (scan area: 5 μm × 2.5 μm, scan direction: 5 μm), the correspon...

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Figure 3: Images of the Celgard sample topography (scan area: 4 μm × 2 μm, scan direction: 4 μm), the corresp...

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Figure 4: Zoomed-in view of the Celgard sample topography as marked out in Figure 3 obtained using TM imaging at (a) ...

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Figure 5: Comparison of (a) the sample topography and (b) the averaged tip–sample interaction force at the cr...

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Figure 6: Comparison of (a) the sample topography and (b) the averaged tip–sample interaction force at the cr...

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Figure 7: Comparison of (a) the tapping-amplitude-(ratio) error and (b) the averaged tip–sample interaction f...

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Figure 8: Topography images obtained using the TM imaging at the scan rate of 10 Hz of (a) the SBS sample and...

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Figure 9: Schematic block diagram of the proposed AMLM imaging. This figure is an adapted version from [1].

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Published 02 Aug 2017

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